发明名称 Resist and process for forming patterns using the same.
摘要 <p>A process for patterning, which comprises applying a resist material comprising a mixture of at least one polymer selected from the polymers represented by the following formulae I and II, &lt;CHEM&gt; &lt;CHEM&gt; wherein R1 represents an aryl or an aralkyl group, R2 represents hydrogen or an alkyl group, R3, R4, R5 and R6 independently represent hydrogen, a halogen atom, an alkyl, an aryl or an aralkyl group, with the proviso that at least one of R3, R4, R5 and R6 represents an aryl or aralkyl group, with a substance which generates an acid by exposure on a substrate to be treated, followed by exposure and heat treatment, and then developing the system in a downflow stream of oxygen-containing plasma.</p>
申请公布号 EP0465064(A2) 申请公布日期 1992.01.08
申请号 EP19910305644 申请日期 1991.06.21
申请人 FUJITSU LIMITED 发明人 ABE, NAOMICHI;NOZAKI, KOJI
分类号 G03F7/36;G03F7/039 主分类号 G03F7/36
代理机构 代理人
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