发明名称 MANUFACTURE OF SELF MATCHING TYPE THIN FILM TRANSISTOR MATRIX
摘要 <p>PURPOSE:To prevent a lift-off piece from depositing by providing etching selectivity to the resist film and electrode films in other sections, removing only the electrode film on the resist film through etching, then, eliminating the resist film. CONSTITUTION:A resist film 5 is formed on a channel protective film 4 with a gate electrode G as a mask. Next, with this resist film 5 as a mask, the exposed part of the channel protective film 4 is removed. Then, an electrode film 6 is formed and this is subjected to anode oxidation to form on anode oxide film 7 on the surface of the electrode film 6. The anode oxide film 7 formed in this manner has a different etchant for etching from its parent metal of electrode films 6 and 6'. This is used to eliminate the electrode film 6' selectively through the dry etching process. Consequently, at the time of a process of eliminating the resist film 5, the electrode film 6' deposited on it has already been removed so that a lift-off piece will not deposit.</p>
申请公布号 JPH042135(A) 申请公布日期 1992.01.07
申请号 JP19900104069 申请日期 1990.04.18
申请人 FUJITSU LTD 发明人 INOUE ATSUSHI;NAGAHIRO NORIO;KAWAI SATORU
分类号 G02F1/1343;G02F1/136;G02F1/1368;G09F9/30;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L21/336;H01L29/784;G02F1/134 主分类号 G02F1/1343
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