发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device is provided. The semiconductor device includes a semiconductor substrate, a P-well and an N-well disposed in the semiconductor substrate, a source disposed in the N-well and a drain disposed in the P-well, a shallow trench isolation (STI) structure disposed in the P-well, a gate structure disposed on the semiconductor substrate, wherein a portion of the gate structure extends into the semiconductor substrate and is disposed in a location corresponding to the STI structure.
申请公布号 US9419104(B2) 申请公布日期 2016.08.16
申请号 US201414568819 申请日期 2014.12.12
申请人 SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 Fang Lei
分类号 H01L21/336;H01L29/66;H01L29/78;H01L29/06;H01L29/40;H01L29/423 主分类号 H01L21/336
代理机构 Innovation Counsel LLP 代理人 Innovation Counsel LLP
主权项 1. A method of manufacturing a semiconductor device, comprising: providing a semiconductor substrate; forming a shallow trench isolation (STI) structure in the semiconductor substrate, wherein the STI structure is disposed in a location corresponding to where a P-well is to be formed; performing ion implantation to form the P-well and an N-well in the semiconductor substrate, wherein the P-well is formed surrounding side and bottom portions of the STI structure; forming a recess in the STI structure; forming a gate structure on the semiconductor substrate, wherein a portion of the gate structure extends into the recess; and performing ion implantation to form a source in the N-well and a drain in the P-well.
地址 CN