发明名称 SHAPE MEASURING ENDOSCOPE DEVICE
摘要 PURPOSE:To project the linear pattern light and to execute the shape measurement with high accuracy by providing a pattern projection member so that a laser beam after polarization is made incident vertically against the pattern projection member. CONSTITUTION:A laser beam led by an optical fiber 6 is focused and polarized, and thereafter, allowed to pass through a pattern projection member 10 and a pattern projection light is generated, and by projecting the pattern projection light to an object 2 to be photographed and detecting an obtained reflected light by an image pickup element, a shape of the object 2 to be photographed is measured. In this case, the pattern projection member 10 is provided so that a laser beam after polarization is made incident vertically against the pattern projection member 10. In such a way, a pattern light projected to the object 2 to be photographed becomes linear, and the shape measurement can be executed with high accuracy.
申请公布号 JPH03295532(A) 申请公布日期 1991.12.26
申请号 JP19900097772 申请日期 1990.04.16
申请人 TOSHIBA CORP 发明人 SAITO SATOSHI
分类号 G02B23/24;A61B1/00 主分类号 G02B23/24
代理机构 代理人
主权项
地址