| 发明名称 |
Apparatus for analysis of a material. |
| 摘要 |
<p>Apparatus for the analysis of a material comprising a measurement probe (3) comprising a source of electromagnetic radiation disposed beneath a retractable screen (6), the source (3) and the screen (6) being arranged in an enclosure (2) fitted with a retractable cover (10) above the screen (6). <IMAGE></p> |
| 申请公布号 |
EP0461698(A1) |
申请公布日期 |
1991.12.18 |
| 申请号 |
EP19910201339 |
申请日期 |
1991.06.03 |
| 申请人 |
SOLVAY & CIE (SOCIETE ANONYME) |
发明人 |
ROQUIGNY, ROGER;NENIN, VICTOR |
| 分类号 |
G01B15/02 |
主分类号 |
G01B15/02 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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