发明名称 DIELECTRIC STRUCTURES WITH EMBEDDED MATERIAL RESISTANT TO ETCHING AND METHOD OF FABRICATION THEREOF
摘要 <p>Structures containing a dielectric material (2) having a polymeric reactive ion etch (RIE) barrier (14) embedded therein. The preferred dielectric materials are polymers, preferably polyimide materials. The RIE etch barrier (14) is a copolymer having an aromatic component having high thermal stability and having a cross-linking component selected from metallocyclobutane, metallobutene and vinyl groups. The etch barrier (14) is deposited as a solvent free liquid which can fill gaps (30) between the dielectric material and electrical conductors embedded therein. The liquid polymer is cured to a solid insoluble state. The structures with electrical conductors embedded therein are useful for electronic applications.</p>
申请公布号 EP0403817(A3) 申请公布日期 1991.12.18
申请号 EP19900109857 申请日期 1990.05.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BABICH, EDWARD D.;HATZAKIS, MICHAEL;MCGOUEY, RICHARD P.;NUNES, SHARON, L.;PARASZCZAK, JURIJ R.;SHAW, JANE M.
分类号 B32B7/02;C08L83/14;H01B3/18;H01L21/302;H01L21/3065;H01L21/48;H01L23/14;H01L23/498;(IPC1-7):H01L23/14 主分类号 B32B7/02
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