发明名称 |
TEST FIXTURE FOR TAB CIRCUITS AND DEVICES |
摘要 |
A test fixture for TAB (Tape Automated Bonding) circuits includes circuit boards for maintaining a characteristic impedance to inner head bond areas of a circuit under test. A plurality of vertically disposed test pins are soldered to conductors in one of the circuit boards, and provide contacts for supplying power and test signals to test pads on a circuit under test. A thermoelectric heat pump is thermally connected to a circuit under test with a copper thermal chuck or heat spreader, and is used to subject the circuit to a wide range of operating temperatures. A two piece anvil is provided to apply pressure to the test pad/test pin interface and to the circuit die/thermal chuck interface. |
申请公布号 |
CA1293336(C) |
申请公布日期 |
1991.12.17 |
申请号 |
CA19890594756 |
申请日期 |
1989.03.23 |
申请人 |
DIGITAL EQUIPMENT CORPORATION |
发明人 |
FLATLEY, ROBERT J.;HOBSON, DAVID |
分类号 |
G01R31/26;G01R1/04;G01R1/073 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|