发明名称 TEST FIXTURE FOR TAB CIRCUITS AND DEVICES
摘要 A test fixture for TAB (Tape Automated Bonding) circuits includes circuit boards for maintaining a characteristic impedance to inner head bond areas of a circuit under test. A plurality of vertically disposed test pins are soldered to conductors in one of the circuit boards, and provide contacts for supplying power and test signals to test pads on a circuit under test. A thermoelectric heat pump is thermally connected to a circuit under test with a copper thermal chuck or heat spreader, and is used to subject the circuit to a wide range of operating temperatures. A two piece anvil is provided to apply pressure to the test pad/test pin interface and to the circuit die/thermal chuck interface.
申请公布号 CA1293336(C) 申请公布日期 1991.12.17
申请号 CA19890594756 申请日期 1989.03.23
申请人 DIGITAL EQUIPMENT CORPORATION 发明人 FLATLEY, ROBERT J.;HOBSON, DAVID
分类号 G01R31/26;G01R1/04;G01R1/073 主分类号 G01R31/26
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