发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the assembling yield of a semiconductor device by adding oxygen plasma treatment and a fluoric acid solution treatment to a substrate formed with metallic electrodes on function regions to clean the front and back surfaces, and then forming back surface electrode, threby enabling preferable bonding. CONSTITUTION:After base electrode 7 and emitter electrode 8 contacted with diffused regions 2, 3 are formed of aluminm or the like in the step of manufacturing, for example, a bipolar transistor, a wafer 1 is treated in oxygen plasma. After organic material adhered on the surfaces of the electrodes 7, 8 is removed with this treatment, it is treated with fluoric acid to remove an oxidized film formed on the back surface, and a collector electrode 10 is formed. Thus, the electrode 10 can be formed without intermediary of contaminant, and the surfaces of the electrodes 7, 8 are cleaned, thereby enabling the preferable wire bonding.
申请公布号 JPS5749243(A) 申请公布日期 1982.03.23
申请号 JP19800125714 申请日期 1980.09.08
申请人 MITSUBISHI DENKI KK 发明人 NAGAI HIROTAKE
分类号 H01L21/60;H01L21/02;H01L21/306 主分类号 H01L21/60
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