| 摘要 |
PURPOSE:To analyze material by computing specified two kinds of indexes L1 and L2 based on the actually measured X-ray diffraction data of an unknown sample and the standard data of the X-ray diffractions of various kinds of materials, and retrieving the material having the large index value. CONSTITUTION:Specified indexes L1 and L2 are computed by using a diffraction-line number No in standard data, a diffraction-line number no that agrees with the actually measured diffraction lines of an unknown sample, an actually measured diffraction-line number N of the unknown sample and a line number (n) that agrees with the diffraction lines of the standard data. When the unknown sample is the single material, L1=L2=1o. Since there is a case wherein the diffraction lines of other materials are overlapped, however, the single component cannot be judged even if both L1 and L2 are closed to 1. However, when L1 is small and L2 is large, mixing of other component is found. When only L1 is specified as the index, the secondary component might be missed. Balance is obtained between the fact that L2 is the square of no/N and the fact that L1 is the product of two terms. L1 and L2 are made to have about equal value. Thus, the difference in numerical values in the case of agreement/ disagreement is expanded. The judging accuracy of the sample component is improved by using two kinds of indexes. |
