发明名称 TEACHING METHOD FOR PACKAGED SUBSTRATE INSPECTION INSTRUMENT
摘要 PURPOSE:To improve the teaching efficiency by displaying a norm land shape on a display screen over an actual image of a land mutually and registering the norm shape as a formal land shape when the degree of their confirmity satisfies standards. CONSTITUTION:When lands 5a and 5b to be combined with a specific component 3 are taught, the norm land shapes 4a and 4b of the component are displayed automatically on the display screen, so the degree of the conformity of the lands with the shape of the real image is checked and the norm shapes are registered as formal land data when the standards are satisfied. When not, the individual land shapes are taught from the real image and registered as correction data. When the extent of the coincidence of the positions do not satisfy standards before the shape conformity is checked, the couple of norm shapes are moved in parallel to increase the degree of the position coincidence. When the position coincidence still does not reach the standards, a shifting norm shape is moved to obtain a position coincidence above the standards, and the shape conformity begins to be checked.
申请公布号 JPH03282307(A) 申请公布日期 1991.12.12
申请号 JP19900085314 申请日期 1990.03.30
申请人 SANYO ELECTRIC CO LTD 发明人 NAKAGAWA TOSHIO;KAWAHARA TOSHIHIRO;OHATA HIDEYA;TAMURA TAKASHI
分类号 G01B11/24;G01N21/88;G01N21/93;G01N21/956;G06T1/00;G06T7/00;H05K13/08 主分类号 G01B11/24
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