| 摘要 |
Apparatus for examining the shape and/or dimensions of an object wherein an object is fed to a test station on a stepping conveyor, the object is illuminated within the test station and scanned by two linear charge-coupled camera devices acting in mutually perpendicular directions across and along the conveyor. Logic circuitry processes the video signals to provide raw measurement signals fed into a microprocessor for analysing the signals and for providing control signals for a downstream reject mechanism. |
