| 摘要 |
A component, and system including the component, are disclosed which provide for improved continuity testing after board assembly. The component includes an additional diode, connected between a terminal of the component which is connected in parallel to other components and a test terminal. The test terminal is dedicated to the component, and is not connected, during continuity testing, to other lines or to other components. Test of electrical continuity between the component and the circuit board on which it is mounted is made by biasing the line which is intended to be connected to the test terminal, relative to the line which is intended to be connected to the parallel terminal, in such a manner that the additional diode will be forward biased, if continuity is present. Measurement of the impedance (either measurement of the voltage if current is sourced, or measurement of current if voltage is sourced) between the test line and the signal line will indicate continuity or absence thereof. The diode may be biased to a power supplied line during normal operation to provide clamping of signals applied to the component.
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