发明名称 METHOD AND DEVICE FOR MEASURING SURFACE TEMPERATURE EMISSIVITY
摘要 PURPOSE:To measure surface temps. and emissivities simultaneously by disposing a cavity in proximity to the surface to be measured, detecting the synthesized radiation in the cavity through the small hole in the upper part and detecting the radiation from the surface to be measured. CONSTITUTION:A cavity 14 is disposed with its opening 10 located in proximity to the surface 18 to be measured. The temp. Tw of the inside wall of the cavity 14 is maintained constant by a temp. setter 20 and a thermocoupler Tc, and the synthesized radiation in the cavity 14 is detected with a radiation thermometer 16 through the small hole 12 in the upper part. The radiation from the surface 18 is detected with a radiation thermometer 22. The indicated values S1, S2 of the thermometers 16, 22 and the temp. Tw of the cavity 14 are fed to an arithmetic device 24 by which the surface temp. and emissivity are calculated. These are displayed in a display device 26. Thereby, the surface temp. and emissivity are measured simultaneously.
申请公布号 JPS5750631(A) 申请公布日期 1982.03.25
申请号 JP19800126909 申请日期 1980.09.12
申请人 KAWASAKI SEITETSU KK 发明人 TAMURA KIYOSHI;KURITA KUNIO
分类号 G01J5/00;G01J5/52 主分类号 G01J5/00
代理机构 代理人
主权项
地址