| 摘要 |
A testing method of a logic circuit which can change test data in a testing apparatus and an apparatus which is used for the testing method are disclosed. The logic circuit testing apparatus having a first storage to store test data including a plurality of test patterns and a second storage to store each of the test patterns in correspondence to a group of tester pins further has a transfer circuit including a data converter to change the test patterns from the first storage and a third storage to store control data to control the data converter. The transfer circuit transfers each of the test patterns from the first storage to the second storage. When the test pattern is transferred by the transfer circuit, the test pattern is changed by the data converter by the control data. |
