发明名称 Manufacturing method of a channel in MOS semiconductor devices.
摘要 <p>Formed on the element region (13) of an n-type semiconductor substrate (12) is a silicon oxide layer (14), on which a polysilicon layer (15) is formed. Boron ions, p-type impurities, are then implanted into the polysilicon layer (15), from which boron diffuses into the element region (13) via the silicon oxide layer (14), with the result that a p-channel region of the p-channel MOS transistor is formed. <IMAGE> <IMAGE></p>
申请公布号 EP0459398(A2) 申请公布日期 1991.12.04
申请号 EP19910108692 申请日期 1991.05.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TOYOSHIMA, YOSHIAKI;EGUCHI, TAMAO
分类号 H01L21/225;H01L21/336;H01L29/10;H01L29/78 主分类号 H01L21/225
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