发明名称 FAULT DIAGNOSTIC CIRCUIT
摘要 PURPOSE:To reduce the circuit scale by using a comparison timing pulse to compare held input data and read data with each other at the time when data corresponding to held input data is read out from a memory means. CONSTITUTION:Address data out of data written in a memory means 1 is held in a data holding and comparing means 5 by a holding timing pulse, and the comparison timing is used to detect coincidence/disaccord between read data and held data when address data is read out. Since an (N+1)-ary counter means 4 has a period one clock longer than that of an N-ary counter means 2, next address data in the memory means 1 is held in the data holding and comparing means 5 just after data comparison. That is, the address to be held and com pared is successively shifted by the (N+1)-clock period to diagnose all addresses. Thus, it is unnecessary to hold data of all addresses, and the circuit scale is reduced.
申请公布号 JPH03271846(A) 申请公布日期 1991.12.03
申请号 JP19900071343 申请日期 1990.03.20
申请人 FUJITSU LTD 发明人 IKUTA KOJI;OGATA HIROKI
分类号 G06F12/16;G06F11/22 主分类号 G06F12/16
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