发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 The semiconductor device with bipolar transistor, nMOS and pMOS formed on one chip is manufactured by the following steps; (a) forming twin buried layers (2,3) on silicon substrate (1); (b) epitaxial growing the silicon (4) on the buried layer; (c) forming a oxide layer (5) and nitride layer (6) on (4); (d) removing a part of (6),(5) and (4) in sequence by common lithography processing; (e) implanting the first conductive type impurity at the etched region of (4); (f) forming a LOCOS layer (9) on the etched epitaxial layer (4); (g) implanting the second conductive type impurity at the non-etched epitaxial layer after etching the nitride layer (6); etching the LOCOS layer and oxide layer (5).
申请公布号 KR910009739(B1) 申请公布日期 1991.11.29
申请号 KR19880008698 申请日期 1988.07.13
申请人 SAM SUNG ELECTRONICS CO.,LTD. 发明人 KANG CHANG-WON;MIN SEONG-GI;YUN JONG-MIL
分类号 H01L29/73;H01L21/331;H01L21/763;H01L21/8249;H01L27/06;H01L29/68;H01L29/70;(IPC1-7):H01L29/68 主分类号 H01L29/73
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