发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The semiconductor device with bipolar transistor, nMOS and pMOS formed on one chip is manufactured by the following steps; (a) forming twin buried layers (2,3) on silicon substrate (1); (b) epitaxial growing the silicon (4) on the buried layer; (c) forming a oxide layer (5) and nitride layer (6) on (4); (d) removing a part of (6),(5) and (4) in sequence by common lithography processing; (e) implanting the first conductive type impurity at the etched region of (4); (f) forming a LOCOS layer (9) on the etched epitaxial layer (4); (g) implanting the second conductive type impurity at the non-etched epitaxial layer after etching the nitride layer (6); etching the LOCOS layer and oxide layer (5).
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申请公布号 |
KR910009739(B1) |
申请公布日期 |
1991.11.29 |
申请号 |
KR19880008698 |
申请日期 |
1988.07.13 |
申请人 |
SAM SUNG ELECTRONICS CO.,LTD. |
发明人 |
KANG CHANG-WON;MIN SEONG-GI;YUN JONG-MIL |
分类号 |
H01L29/73;H01L21/331;H01L21/763;H01L21/8249;H01L27/06;H01L29/68;H01L29/70;(IPC1-7):H01L29/68 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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