| 摘要 |
PURPOSE:To make a time for preparation of data on a function test and a time for the test shorter than usual ones on the occasion of the function test, by preparing a partition by selecting a cone having the closest relation out of divided cones. CONSTITUTION:A logic circuit on a printed circuit board is divided into a plurality of cones 21 to 23 by a dividing means 11. By a table preparing means 12, a table comprising a cone number, multiplicity between cones, the number of logic gates contained in the cone and pointers indicating the cones put in multiple is prepared for each of the aforesaid cones 21 to 23 in a plurality. Based on the table prepared by the table preparing means 12, a partition preparing means 13 lessens overlapping of the cones with each other in a partition, taking the overlapping of the logic gates between the cones into consideration. Accordingly, a time for preparation of data on a function test and a time for the test can be shortened. |
