| 摘要 |
<p>A charged particle energy analyser includes two hemispherical electrodes (19,21) and means (22) for developing an inverse square electric field in the gap between the two electrodes. An afocal charged particle lens arrangement (9,11) is arranged to project a charged particle image of a sample (3) into the electric field such that the particles' trajectory in the field will depend on their energy, position in the image, and orientation relative to the charged particle optical axis of the analyser. Two baffles (27,29) are disposed in the gap between the electrodes (19,21), the baffles (27,29) being effective to restrict the energy and angular divergence of the particles transmitted by the analyser, the baffles being positioned so as to reduce the dependence of the energy and the orientation of the charged particles transmitted by the baffles on the position of the particles within the image A two-dimensional detector (33,35) is arranged to detect the charged particle image transmitted by the analyser. <IMAGE></p> |
