发明名称 |
Method and apparatus for testing delta-sigma modulators. |
摘要 |
<p>A delta-sigma modulator (14) is tested by sampling an input test signal at a first rate (in 24) and inputting the samples to the delta-sigma modulator under test so that the modulator outputs a digital signal representative of each sample. The input signal is also sampled at a second rate (in 26) and an error factor is then established (by 28) in accordance with the difference between the value of the output signal produced by the delta-sigma modulator and the value of the sample obtained by sampling the input signal at the second rate. By comparing the error factor to a prescribed value, the proper operation of the delta-sigma modulator can be verified. <IMAGE></p> |
申请公布号 |
EP0458515(A2) |
申请公布日期 |
1991.11.27 |
申请号 |
EP19910304333 |
申请日期 |
1991.05.15 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
TSAI, SHENG-JEN |
分类号 |
G01R29/26;G01R31/00;H03M1/10;H03M3/02 |
主分类号 |
G01R29/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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