| 摘要 |
PURPOSE:To execute a burn-in test with a small number of input/ output signals and to improve testing accuracy by updating an address signal after making access a micro ROM with a prescribed address. CONSTITUTION:A selective instructing means 10 instructs a prescribed selective operation while replying to a test signal from outside a chip, and a selective means 11 selects the prescribed address according to the above-mentioned instruction. Access to the micro ROM 12 is performed by a selected address signal, and the address signal after access is incremented with an address updating means 13, thereby setting as a prescribed address signal. At this time, a microinstruction in the ROM 12 is read out autonomously and sequentially, and each functional circuit is operated sequentially based on the instruction. Thereby, it is possible to dispense with a command and a parameter at every processing, and to execute the burn-in test with a small number of input/output signals, which reduces a test cost and improves the testing accuracy. |
