发明名称 Blanking aperture array and method of producing same.
摘要 <p>The array is intended to be used in an electron beam exposure system and is obtained by forming an electrode layer (34) on a substrate (20) having shift register devices (24). An electron beam aperture (38) is formed in a same position through the substrate and electrode layer, so as to effectively form deep electron beam apertures. <IMAGE> <IMAGE></p>
申请公布号 EP0457632(A2) 申请公布日期 1991.11.21
申请号 EP19910401008 申请日期 1991.04.16
申请人 FUJITSU LIMITED 发明人 TAKAHASHI, YASUSHI;SAITO, TOMIYASU
分类号 H01L21/027;H01J37/04;H01J37/317;H01L21/30 主分类号 H01L21/027
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