发明名称 Swivelable mass spectrometer to measure properties of particle stream - provides in-situ measurement of mass-, energy-and angular-distribution e.g. for integrated circuit
摘要 Measurement of physical properties of a particle stream of large cross-section emanating from esp. a dry etching unit used for prodn. of integrated circuits, comprises deflecting a thin beam from the stream into the measuring unit contg. a swivelable mass spectrometer for determining the mass-, energy- and angular-distribution of the particles in the stream. The particle stream is measured at selected intervals from the particle source. The unit comprises an evacuatable process chamber (5) with a source adaptor as a vacuum-tight coupling between chamber and particle source. A diaphragm unit with a small shutter separates the measuring unit from the particle source. ADVANTAGE - A single measuring unit determines the various properties.
申请公布号 DE4016108(A1) 申请公布日期 1991.11.21
申请号 DE19904016108 申请日期 1990.05.18
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG EV, 8000 MUENCHEN, DE 发明人 JANES, JOACHIM, 1000 BERLIN, DE
分类号 H01J37/32;H01J49/10;H01J49/42 主分类号 H01J37/32
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