发明名称 MEASURING METHOD FOR FINE CLEARANCE
摘要 PURPOSE:To measure for clearance rapidly with high precision by arranging plural sensors for picture-element detection opposite to interference stripes generated in corresponding to clearance between two bodies, and by detecting light parts and dark parts of the interference stripes. CONSTITUTION:Light from light source 1 is passed through a filter 2 to obtain monochromatic light, which is projected upon a slider 6 through a half-mirror 4 and a glass disk 5. Reflected light from the surface of the slider 6 and that from the surface of the glass disk 5 from interference stripes, which are imaged on a line camera 5 through a lens 8. The position of a slider surface 6 on the camera 7 from a slide-level setting circuit 13 is determined. Outputs in one clock from a clock generator 10 are compared mutually through a sample holding circuit 14, an AD converter 15, a latch circut 16, and a comparator 17 and a comparator 18 is opened according to an increase in the difference to input a sensor number and a level to a data processing circuit 19, thereby measuring fine clearance rapidly with high precision by the positions of the light and dark parts of the interference strips.
申请公布号 JPS5759106(A) 申请公布日期 1982.04.09
申请号 JP19800132897 申请日期 1980.09.26
申请人 HITACHI SEISAKUSHO KK 发明人 TERAJIMA SEIICHIROU
分类号 G01B11/00;G01B11/14 主分类号 G01B11/00
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