发明名称 |
ULTRASONIC FLAW DETECTION APPARATUS |
摘要 |
PURPOSE:To detect a flaw with high reliability by reducing a flaw undetected region by calculating the distance up to the corner part of an oblique angle probe by utilizing the beam distance up to the bottom surface of a material to be inspected due to the ultrasonic beam of an oblique probe. CONSTITUTION:A beam distance operation circuit 11 uses the distance X up to the bottom surface of a material 1 to be inspected measured by the vertical probe 2a present at the almost same position as an oblique angle probe 2n and the distance S from the probes 2a, 2n to the side surface of the material 1 to be inspected is used to calculate the distance Y up to the corner part to which the beam from the oblique angle probe 2n goes. When the position of a bottom surface echo B moves to a position B' by some cause, since a flaw detection gate FG changes like FG' according to the moving quantity, the position of the flaw detection gate FG is controlled according to the fluctuation of the distance Y up to the corner part so as to follow a member 9 to prevent the generation of a flaw undetected region or the erroneous detection of the bottom surface echo. |
申请公布号 |
JPH03257362(A) |
申请公布日期 |
1991.11.15 |
申请号 |
JP19900056897 |
申请日期 |
1990.03.08 |
申请人 |
MITSUBISHI ELECTRIC CORP;NIPPON STEEL CORP |
发明人 |
YOSHIDA MITSUO;FUJISAWA JUNICHI;SUGIMOTO YUKIRO;MITANI YUKIO |
分类号 |
G01N29/04;G01N29/22;G01N29/38 |
主分类号 |
G01N29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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