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发明名称
UEBERWACHUNG DER AETZGESCHWINDIGKEIT DES SIO2/FOTORESIST-VERHAELTNISSES IN EINEM AETZVERFAHREN ZUR EINEBNUNG VON QUARZ.
摘要
申请公布号
DE3584297(D1)
申请公布日期
1991.11.14
申请号
DE19853584297
申请日期
1985.01.17
申请人
INTERNATIONAL BUSINESS MACHINES CORP., ARMONK, N.Y., US
发明人
CHEN, LEE, POUGHKEEPSIE NEW YORK 12603, US;MATHAD, GANGADHARA SWAMI, POUGHKEEPSIE NEW YORK, US
分类号
H01L21/302;H01L21/3065;H01L21/3105;H01L21/311;(IPC1-7):H01L21/306
主分类号
H01L21/302
代理机构
代理人
主权项
地址
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