发明名称 LOOPBACK TEST CIRCUIT
摘要 <p>PURPOSE:To prevent the malfunction of information circulated in the same block repetitively by providing a selector selecting either a loop bit sent from a subsequent transmitter or a loop bit representing no loopback and sending the selected loop back bit to a host transmitter to each transmitter. CONSTITUTION:A selector 14a selecting either a loop bit sent from an adjacent transmitter or a loop bit representing no loopback and sending the selected loop bit to a host transmitter to a transmitter CNEb and the transmitter CNEb for which loopback is instructed by the loop bit allows the selector 14a to select the loop bit representing no loopback and sends the selected loop bit to a loopback side transmitter. That is, the loopback station CNEb does not send a loop bit in a direction of A C but sends a loop bit set to 0 instead in the direction of C. Thus, the circulation of a signal through the same block due to the duplication of the loopback is prevented.</p>
申请公布号 JPH03254224(A) 申请公布日期 1991.11.13
申请号 JP19900051345 申请日期 1990.03.02
申请人 FUJITSU LTD 发明人 SHIRAI MASAHIRO;MIYAWAKI HIROTOMO;NAKAMURA SHINICHI;YOGOSHI NORIYUKI;SAGAWA SHIGEATSU
分类号 H04B3/46 主分类号 H04B3/46
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