| 摘要 |
<p>An input matching network in an input circuit of an amplifier comprises a basic input matching circuit (50) including a serial inductance, a strip line of an approximately quarter wavelength connected in series to the basic matching circuit, and a parallel capacitance including an open stub (S1) connected between the strip line and the basic input matching circuit (50). An electrical length (l epsilon ) of the open stub (S1) is selected such that a phase angle of a signal source reflection coefficient as viewed from the amplifier is larger than a mean value of manufacturing variations of a phase angle of an optimum signal source power reflection coefficient of the amplifier. By shortening the electrical length (l epsilon ) of the open stub (S1) by cutting it by a laser, a matching point can be adjusted to comply to substantially entire distribution of the manufacturing variations of the optimum signal source power reflection coefficient of the amplifier. <IMAGE></p> |
