发明名称 Process for simultaneously fabricating isolation structures for bipolar and CMOS circuits
摘要 An isolation structure for bipolar and CMOS circuits formed during the same processing steps to optimize the integration of bipolar and CMOS circuits. A deep trench (46) is formed in a semiconductor circuit for providing deep isolation for bipolar circuits. A shallow recess (56) is then formed simultaneous with a stepped sidewall structure of the deep trench. The recess (56) and the trench (46) are covered by an insulating oxide (60). and thereafter filled with an undoped polysilicon (62) to form the different isolating structures for the different types of circuits.
申请公布号 US5065217(A) 申请公布日期 1991.11.12
申请号 US19900630374 申请日期 1990.12.18
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 VERRET, DOUGLAS P.
分类号 H01L21/763 主分类号 H01L21/763
代理机构 代理人
主权项
地址