发明名称 Apparatus and method for analyzing dielectric properties using a single surface electrode and force monitoring and adjusting
摘要 A parallel plate or single surface dielectric analyzer is disclosed including: a distance sensor for accurately measuring the varying distance between the electrodes, such as a linear voltage differential transformer (LVDT), and apparatus responsive to the distance sensor for positioning the electrodes; a force transducer for measuring the applied force on the sample and apparatus responsive to the force transducer to give a desired force by varying the electrode spacing; disposable electrodes made using thick film technology composed of a ceramic substrate with a conductor adhered to its surface; and a temperature sensor built into one of the electrodes such as a platinum ring adhered to the surface of one of the electrodes and apparatus to measure the resistance across the platinum ring.
申请公布号 US5065106(A) 申请公布日期 1991.11.12
申请号 US19910660169 申请日期 1991.02.25
申请人 TA INSTRUMENTS, INC. 发明人 HENDRICK, KENDALL;READER, JR., JOHN R.
分类号 G01B7/14;G01N27/22;G01R27/26 主分类号 G01B7/14
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