| 摘要 |
PURPOSE:To enable measurement of the total reflection spectrum of a sample by bringing the sample into contact with one surface of a high-refraction medium and by taking outside a light of the total reflection spectrum based on absorption by the sample. CONSTITUTION:A light from a light source 7 is condensed by mirrors 12A and 11A, led to the fore end of a light incidence path 4 in a sample chamber 8, introduced into a high-refraction medium 3 of a pen-type optical device 1 for measurement, subjected to repeated total reflection, transmitted into the chamber 8 again through a light emission path 5 and sensed by a light-sensing unit 9 via mirrors 11B and 12B. In a state wherein the device 1 is combined with an optical system of a spectroscope, a measuring surface A of the device 1 is brought into contact with a material 13 to be measured and an absorption spectrum in a prescribed wavelength region is measured by scanning. Then a light of a multiple reflection spectrum obtained by the surface absorption of the sample 13 on the basis of the total reflection on the surface A is led to the light-sensing unit 9 and a total reflection spectrum 10 is obtained. |
