发明名称 TESTING DEVICE FOR SAFE PROTECTION SYSTEM FUNCTION
摘要 <p>PURPOSE:To prevent a wrong scramming function which is requested for a function test and a safe protecting function after the test from being lost by separating a controller for a logic circuit and a function testing device across hardware. CONSTITUTION:When the safe protecting function testing device 1 conducts the function test, a logic circuit output by-pass 11 is put in operation to output a logic circuit normalcy signal 12 and by-pass a scramming signal 16, thereby preventing a wrong scramming signal from being outputted. For safe protection in and after the test, a function test selection switch 8 is operated to input a function testing device connection signal 9 to a safe protection system controller 15 and then a function testing device connection part 10 by-passes a sensor output signal 13, permits a dummy signal 4 to be inputted from the device 1, and inputs the operation signal 6 of the logic circuit 14 to the device 1. Then the test is conducted through this connection part 10 to prevent the safe protecting function from being lost in and after the test.</p>
申请公布号 JPH03252590(A) 申请公布日期 1991.11.11
申请号 JP19900049297 申请日期 1990.03.02
申请人 HITACHI LTD 发明人 FUKUSHIMA HIROSHI
分类号 G21C17/00;G05B23/02 主分类号 G21C17/00
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