发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To easily estimate the power-supply drop value of a power-supply interconnection and to make an internal level easily uniform by a method wherein the power-supply drop value of the power-supply interconnection is changed nearly linearly with reference to an interconnection length. CONSTITUTION:An internal cell region 2 on a substrate 1 is provided with internal cells 3 of M lines and N rows. Power-supply interconnections 5 of the same power supply are installed so as to be extended from one pair of input/output cell regions 4 faced in the line direction of the internal cell regions 2 up to at least one or more maximum (M-1)-th internal cells 3. As a result, the power-supply interconnections 5 with reference to the individual internal cells 3 are formed without being missed and the power-supply interconnections 5 extended from one pair of faced input/output cell regions 4 are formed so as not to be crossed. In this manner, the power-supply drop value of the power- supply interconnections 5 is changed nearly linearly with reference to an interconnection length. Thereby, the power-supply drop value of the power-supply interconnections 5 can be estimated easily, a discrepancy between an initially estimated power-supply drop value and an actual power-supply drop value can be reduced, and an internal level can be made easily uniform.</p>
申请公布号 JPH03250735(A) 申请公布日期 1991.11.08
申请号 JP19900047976 申请日期 1990.02.28
申请人 FUJITSU LTD;FUJITSU VLSI LTD 发明人 MORITA AKIO
分类号 H01L21/3205;G11C11/401;H01L21/82;H01L21/822;H01L23/52;H01L27/04;H01L27/118 主分类号 H01L21/3205
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