Measuring control for capacitor testing and sorting - using standard reference component to provide mean measurement value and standard deviation

摘要

The measuring control system uses a reference component positioned in one of the cells around a turntable plate, which exhibits stable parameter values. The latter are repeatedly measured to obtain a mean measurement value and a standard deviation, used to provide frame values, with a subsequent series of measurements providing a new mean value and standard deviation for comparison with the frame values. When the new values differ from the frame values, the operation of the device is halted, or a correction procedure is initiated. USE - For testing and sorting device for chip capacitors.