发明名称 MULTI-FUNCTIONAL MEASUREMENT SYSTEM
摘要 <p>A multi-purpose probe module (82), comprising both a touch-trigger type contact probe (84) and a non-contact type probe (86), is used in method and apparatus for monitoring and adjusting the accuracy of a computer-controlled machine for manufacturing precision bevel and hypoid gears. The probe module (82) is mounted on the machine's tool support (12) and is used in conjunction with locating points positioned on the machine's work support (14) to monitor and recalibrate the relative positions of the tool and work supports. The probe module (82) is also used to monitor the flanks of the gear-shaped workpieces (a) for initial stock division, (b)for pre-machining accuracy, (c) for first-piece testing, (d) for in-process accuracy, and (e) for post-machining accuracy. The same probe module (82) is used in combination with a sacrificial test wafer (120) mounted on the work support (14) for adjusting the position of the machine's cup-shaped grinding wheel (28) following each dressing of the latter's working surfaces.</p>
申请公布号 WO1991016673(A1) 申请公布日期 1991.10.31
申请号 US1991000735 申请日期 1991.02.04
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