| 摘要 |
PURPOSE:To shorten the diagnosing time by deciding whether the occurring frequency of restartable faults exceeds an allowable range or not and at the same time whether a period covering the time of the last function test through the present diagnostic time exceeds a test grace period or not. CONSTITUTION:A clocking part 28 carries on the clocking even in a pause state of a device, a diagnostic information storage part 29 stores various decision information to decide whether a function test should be carried out or not, and an information input part 30 inputs these decision information to the part 29. Then it is decided whether the occurring frequency (n) of restartable faults exceeds an allowable range N or not. The present diagnostic time t2 is read out of the part 28 and it is decided whether the time (t2 - t1) exceeds a test indulgence period or not (t1: execution time of the last function test). Then no function test is carried out and a normal working state is self- diagnosed only when n>=N and also (t2 - t1) >=T are satisfied. |
