IDENTIFICATION OF DEFECTS IN EMITTER-COUPLED LOGIC CIRCUITS,申请号EP19890480165-传众专利搜索

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发明名称	IDENTIFICATION OF DEFECTS IN EMITTER-COUPLED LOGIC CIRCUITS
摘要
申请公布号	EP0369921(A3)	申请公布日期	1991.10.23
申请号	EP19890480165	申请日期	1989.10.24
申请人	INTERNATIONAL BUSINESS MACHINES CORPORATION	发明人	CECCHI, DELBERT RAYMOND;PHAN VAN, NGHIA
分类号	G01R31/317;G01R31/30;H03K19/00;H03K19/086;(IPC1-7):G01R31/28	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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