发明名称 |
Parametric measurement unit/device power supply for semiconductor test system |
摘要 |
Disclosed is a device power supply in a semiconductor test system for supplying programmed test pattern voltages to a semiconductor device under test and for current range switching of current range resistors without effecting the output voltage of the device power supply.
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申请公布号 |
US5059889(A) |
申请公布日期 |
1991.10.22 |
申请号 |
US19900490803 |
申请日期 |
1990.03.08 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
HEATON, DALE A. |
分类号 |
G01R31/26;G01R31/28;G01R31/30;G01R31/319;G05F1/00;G05F1/575 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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