发明名称 Circuit for adjusting voltage level of data output in a semiconductor memory device
摘要 The circuit for adjusting voltage level of data output in a semiconductor memory device, thereby having a high speed in its access time. The improvement comprises a power supply terminal; a ground reference voltage terminal; a data output terminal; a data output driving controller for receiving amplified sensing signals and outputting said signals in response to an enable clock; driving circuitry for outputting data output to the data output terminal in response to the signals outputted from the data output driving controller; control pulse generating circuitry receiving the enable clock, for generating an output data control pulse when the data output is completed by the enable clock; and high-impedance voltage generating circuitry for generating voltage level of high-impedance state in response to the output data control pulse and applying said high-impedance voltage to the data output terminal, whereby the voltage level of the data output terminal is controlled to return unconditionally to the high-impedance voltage level from preceding output voltage level.
申请公布号 US5060196(A) 申请公布日期 1991.10.22
申请号 US19900471933 申请日期 1990.01.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PAE, MYOUNG-HO;JUN, DONG-SU
分类号 G11C11/409;G05F1/56;G11C7/10;G11C7/22 主分类号 G11C11/409
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