发明名称 |
Circuit for adjusting voltage level of data output in a semiconductor memory device |
摘要 |
The circuit for adjusting voltage level of data output in a semiconductor memory device, thereby having a high speed in its access time. The improvement comprises a power supply terminal; a ground reference voltage terminal; a data output terminal; a data output driving controller for receiving amplified sensing signals and outputting said signals in response to an enable clock; driving circuitry for outputting data output to the data output terminal in response to the signals outputted from the data output driving controller; control pulse generating circuitry receiving the enable clock, for generating an output data control pulse when the data output is completed by the enable clock; and high-impedance voltage generating circuitry for generating voltage level of high-impedance state in response to the output data control pulse and applying said high-impedance voltage to the data output terminal, whereby the voltage level of the data output terminal is controlled to return unconditionally to the high-impedance voltage level from preceding output voltage level.
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申请公布号 |
US5060196(A) |
申请公布日期 |
1991.10.22 |
申请号 |
US19900471933 |
申请日期 |
1990.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PAE, MYOUNG-HO;JUN, DONG-SU |
分类号 |
G11C11/409;G05F1/56;G11C7/10;G11C7/22 |
主分类号 |
G11C11/409 |
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