发明名称 |
WIRING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The semiconductor device for preventing the short of interconnection is manufactured by: (a) forming a insulating layer (7) for side wall protection on field oxide (2), followed by depositing the conductive layer (3); (b) forming a conductive interconnection (6) by etching the (7) and (3); (c) forming a metal oxide layer (11) on (6); (d) forming a pattern of conductive interconnection protected by insulating layer (7) for side wall protection.
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申请公布号 |
KR910008834(B1) |
申请公布日期 |
1991.10.21 |
申请号 |
KR19880011306 |
申请日期 |
1988.09.01 |
申请人 |
SAM SUNG ELECTRONICS CO. LTD. |
发明人 |
CHO DO-HYUN;YUN HEE-SUN |
分类号 |
H01L21/283;(IPC1-7):H01L21/283 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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