发明名称 WIRING METHOD OF SEMICONDUCTOR DEVICE
摘要 The semiconductor device for preventing the short of interconnection is manufactured by: (a) forming a insulating layer (7) for side wall protection on field oxide (2), followed by depositing the conductive layer (3); (b) forming a conductive interconnection (6) by etching the (7) and (3); (c) forming a metal oxide layer (11) on (6); (d) forming a pattern of conductive interconnection protected by insulating layer (7) for side wall protection.
申请公布号 KR910008834(B1) 申请公布日期 1991.10.21
申请号 KR19880011306 申请日期 1988.09.01
申请人 SAM SUNG ELECTRONICS CO. LTD. 发明人 CHO DO-HYUN;YUN HEE-SUN
分类号 H01L21/283;(IPC1-7):H01L21/283 主分类号 H01L21/283
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