发明名称 Mass-spectrometer measuring ions and neutral particles - uses retractable probe and HF-plasma for neutrals
摘要 The beam from a primary ion source (3) in a vacuum vessel (1) passes through a raster system (15) onto a probe which is retractable from the lens stage (8) and is a source of secondary ions (6a, 6b). The ions are drawn off by a snow plough electrode and focussed through an electrostatic lens (11) into a mass-spectrometer (12). When the probe is lowered below the lens stage (6b) the neutral particles are ionised in an HF-plasma generated in the lower section by admitting gas through a differential pumping-system. ADVANTAGE - Enables analysis of sec. ions and neutral particles from same ion-source.
申请公布号 DE4111742(A1) 申请公布日期 1991.10.17
申请号 DE19914111742 申请日期 1991.04.06
申请人 OSWALD, STEFFEN, O-8019 DRESDEN, DE;MUCHA, ANDREAS, DIPL.-PHYS., O-8213 BANNWITZ, DE;SIEGERT, LOTHAR, DR., O-8036 DRESDEN, DE 发明人 OSWALD, STEFFEN, O-8019 DRESDEN, DE;MUCHA, ANDREAS, DIPL.-PHYS., O-8213 BANNWITZ, DE;SIEGERT, LOTHAR, DR., O-8036 DRESDEN, DE
分类号 G01N23/225;H01J37/252 主分类号 G01N23/225
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