发明名称 METHOD AND DEVICE FOR DETECTING X-RAY
摘要 PURPOSE:To make good characteristic measurement without depending on the distance between an X-ray detecting section and an X-ray source by making an incident X-ray beam incident perpendicularly on an X-ray detector having an X-ray filter of the largest thickness among plural X-ray detectors. CONSTITUTION:Since X-rays are radially released from an X-ray tube, the position where the X-ray detector having the X-ray filter of the largest thickness among the plural disposed X-ray detectors is disposed is previously marked on the surface of the X-ray detecting section 1 to be irradiated with the X-rays. The detecting section 1 is so set that the surface of the marked part of the detecting section 1 intersects nearly orthogonally with the incident direction of the X-ray beam to be measured at the time of irradiation with the X-ray to be measured. The information signal of the X-ray to be measured detected by the detecting section 1 is amplified in an amplifier section 3 after photoelectric conversion and is once stored in an arithmetic memory section 5 after A/D conversion 4. The signal is then subjected to the prescribed arithmetic processing according to the preprogramed procedures and the desired information (tube voltage, energy distribution, half value layer, etc.) on the X-ray to be measured is determined and is displayed on a display section 6.
申请公布号 JPH03233387(A) 申请公布日期 1991.10.17
申请号 JP19900028456 申请日期 1990.02.09
申请人 KASEI OPTONIX CO LTD 发明人 MIYAKE SHUSAKU
分类号 G01T1/20;G01T7/00 主分类号 G01T1/20
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