发明名称 DEPOSITION AND HARDENING OF TITANIUM GATE ELECTRODE MATERIAL FOR USE IN INVERTED THIN FILM FIELD EFFECT TRANSISTORS
摘要 <p>The gate electrode in an inverted field effect transistor (FET) is fabricated with titanium to provide an FET which is particularly suitable for use as the switching element in a matrix addressed liquid crystal display. More particularly, the resist employed in gate electrode patterning is plasma ashed in an oxygen atmosphere to toughen the titanium gate material and render it more amenable to subsequent processing steps.</p>
申请公布号 EP0211370(B1) 申请公布日期 1991.10.16
申请号 EP19860110376 申请日期 1986.07.28
申请人 GENERAL ELECTRIC COMPANY 发明人 PARKS, HAROLD GEORGE;POSSIN, GEORGE EDWARD
分类号 C23C14/08;C23C14/06;C23C14/14;G02F1/133;G02F1/136;G02F1/1368;H01L21/336;H01L27/12;H01L29/49;H01L29/78;H01L29/786 主分类号 C23C14/08
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