发明名称 CELL SWITCH TEST EQUIPMENT
摘要 <p>PURPOSE:To accurately evaluate the performance of a cell switch by counting number of undelivered test cells and dissident bit number from number of prediction bit patterns between predicted bit pattern and other prediction bit pattern coincident in a preceding time when the bit pattern of an information part and the prediction bit pattern are coincident. CONSTITUTION:A cell input means 53 counts number of inputted test cells, and a test cell whose header part error and mis-distribution are not detected is outputted to cell reception means 551-55j corresponding to a cell generating means generating the test cell. The cell reception means 551-55j counts number of undelivered test cell addressed to itself from the number of prediction bit patterns between the prediction bit pattern coincident at present and the prediction bit pattern coincident in the preceding time and counts of dissident bit number in the information part.</p>
申请公布号 JPH03231537(A) 申请公布日期 1991.10.15
申请号 JP19900026149 申请日期 1990.02.07
申请人 TOSHIBA CORP 发明人 SHOHATA YASURO
分类号 H04Q1/24 主分类号 H04Q1/24
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