发明名称 DETECTION AND MEASUREMENT OF A DC COMPONENT IN AN AC WAVEFORM
摘要 DC offset is measured by separating the positive and negative half cycles of the AC waveform, obtaining a measure of the energy content of each type of half cycle and subtracting one from the other and accumulating the result. The accumulated result is measured against a threshold which is selected to have a known relationship to the units used to measure the DC offset. Each time the threshold is exceeded, this increments a counter and at the same time resets the accumulator. The contents of the counter can then be multiplied by an appropriate scaling factor. The square root of this result gives a measure of DC offset.
申请公布号 US5055773(A) 申请公布日期 1991.10.08
申请号 US19900511352 申请日期 1990.04.17
申请人 ALCATEL N.V. 发明人 THOMAS, LLOYD S.;STANBURY, EVAN J.
分类号 G01R19/25 主分类号 G01R19/25
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