发明名称 MOS MEMORY CELL WITH EXPONENTIALLY-PROFILED DOPING AND OFFSET FLOATING GATE TUNNEL OXIDATION
摘要 MOS MEMORY CELL WITH EXPONENTIALLY-PROFILED DOPING AND OFFSET FLOATING GATE TUNNEL OXIDATION A semiconductor memory device having a CMOS memory cell with a floating gate and increasing concentration of dopant in, the source, drain and channel regions. Typically the concentration profile is generally exponential. The device has relatively high diffusion current densities accelerated toward the surface and directed toward the channel/drain interface. Gate oxidation thickness is reduced over the channel near the drain to create a tunnel "window" in the area of greatest electric field magnitude. The device provides for significantly reduced write times as compared to conventional devices.
申请公布号 CA1290463(C) 申请公布日期 1991.10.08
申请号 CA19890615025 申请日期 1989.09.29
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 ARONOWITZ, SHELDON;FORSYTHE, DONALD D.;WALKER, GEORGE P.;GADEPALLY, BHASKAR V.S.
分类号 H01L21/8247;H01L27/115;H01L29/10;H01L29/36;H01L29/788;H01L29/792 主分类号 H01L21/8247
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