发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To increase an area faced with an upper-part capacitor electrode and to increase a capacitor capacity by a method wherein a lower-part capacitor electrode is formed in such a way that at least one part of the cross section in the channel direction of a word line of a MOS transistor is covered with it. CONSTITUTION:A lower-part capacitor electrode 13 is formed so as to cover the cross section in the channel direction of word lines 61 to 64. In addition, the lower-part capacitor electrode 13 is formed so as to cover a stepped part produced at the connecting part of a bit line 11 to a source/drain diffusion layer 42. That is to say, since the lower-part capacitor electrode 13 is formed in a shape dropped into the stepped part, a curved surface exists there. Since the curved surface exists at the lower-part capacitor electrode 13, this means that an area faced with an upper-part capacitor electrode 15 is increased as viewed from its cross section. When the stepped part produced inevitably at the connecting part of the bit line 11 to the source/drain diffusion layer 42 is utilized positively and effectively, it is possible to reasonably achieve the request for an increase in an capacitor capacity.
申请公布号 JPH03225953(A) 申请公布日期 1991.10.04
申请号 JP19900021541 申请日期 1990.01.31
申请人 TOSHIBA MICRO ELECTRON KK;TOSHIBA CORP 发明人 TANAKA KINUYO;ISHIUCHI HIDEMI;MIZUNO TOMOHISA
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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