| 摘要 |
<p>In order to test data lines of a RAM, a test word is written into all of the address locations of the RAM. The test word is read from all of the address locations of the RAM and a check is made that the test word as read from each of the address locations is the same as the test word written in. The writing, reading and checking operations are then repeated for other test words. The test words are defined as follows. For each value of s from 0 to (n-1), where D is the number of data lines and 2<n> => D > 2<n-1>, there is a first test word which (subject to truncation if necessary to limit the number of bits in the word to D) has groups of 2<s> bits, wherein the bits of each group are of the same binary level and the binary level alternates between groups. Also, for at least one of the values of s from 0 to (n-1), there is a second test word which is the same as the first test word for the same value of s except that the corresponding bits of the two words are of opposite binary level. <IMAGE></p> |
