| 摘要 |
A semiconductor memory device has a sense amplifier which is constructed with a level shift circuit having an input which senses the change in a data line from an initial precharged level to a level near the vicinity of the supply voltage level which corresponds to data reading amounts from a memory cell during the reading mode of operation of the memory. The level shift circuit, in response to a memory cell reading signals, provides a level shifted outpout to the input terminal of a differential sense amplifier circuit, the level shifted output being in the vicinity of the operating point of the differential sense amplifier circuit. The level shift circuit includes a current amplifier having an output terminal that is formed with a series connecting node of a current amplifying transistor and a current source.
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