发明名称 METHOD OF MANUFACTURING INTER-LEVEL CONTACT AND SEMICONDUCTOR STRUCTURE
摘要 PURPOSE: To fully fill up a contact hole with a conductive material by a method, wherein the contact hole is provided to an insulating layer, and an aluminum layer is deposited on the surface of a chip at a high temperature of 150 deg.C or so. CONSTITUTION: A contact hole 16 is provided to an insulating layer 14 for exposing a conductive region located below the insulating film 14, a conductive layer 18 which includes a heat-resistant metal is deposited on the insulating layer 14 and inside the contact hole 16, an aluminum layer 20 is deposited at a temperature above 150 deg.C to form an alloy 22 of aluminum and heat- resistant metal inside the contact hole 16. That is, when the aluminum layer 20 is deposited at a high temperature such as above 150 deg.C, the layer 20 is alloyed with the conductive layer 18 to turn into the aluminum/heat-resistant metal alloy layer 22. The volume of the aluminum/heat-resistant metal alloy is larger than those of aluminum and heat-resistant metal, so that a void space in the contact hole 16 is filled up with an expandable alloy. As mentioned above, the contact hole 16 can be completely filled with conductive material.
申请公布号 JPH03220751(A) 申请公布日期 1991.09.27
申请号 JP19900314450 申请日期 1990.11.21
申请人 S G S THOMSON MAIKUROEREKUTORONIKUSU INC 发明人 FUSEN II CHIEN;FUU TAI RIOU;TEIMOSHII II TAANAA;CHIEECHIA UEI;YUIISHIYAN RIN;GIRITSUSHIYU ANANTO DEIKUSHITSUTO
分类号 H01L21/3205;H01L21/285;H01L21/768;H01L23/485;H01L23/532 主分类号 H01L21/3205
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